THERMAL SCIENCE

International Scientific Journal

Ruyuan Du

,

Huajun Zeng

,

Can Li

NOVEL ANALYTICAL SOLUTIONS FOR TIME-FRACTIONAL THIN-FILM FERROELECTRIC MATERIAL MODEL

ABSTRACT
Thin-film ferroelectric materials have been identified as having significant technological promise in microelectronics, optoelectronics, and sensor applications owing to their distinctive physical properties. The equation for thin-film ferroelectric materials with time-fractional derivatives offers enhanced precision in modeling the physical properties of such systems. The present study proposes a modified extended tanh-function approach to derive novel analytical solutions for the time-fractional thin-film ferroelectric material model. This method has been successfully implemented to derive various exact solutions to the model and plot their 3-D graphs. The findings of this study offer novel theoretical underpinnings for both the theoretical research and practical applications of thin-film ferroelectric materials
KEYWORDS
time-fractional thin-film ferroelectric material model, novel analytical solution, modified extended tanh-function approach
PAPER SUBMITTED: 2024-11-10
PAPER REVISED: 2025-05-12
PAPER ACCEPTED: 2025-05-12
PUBLISHED ONLINE: 2026-04-12
DOI REFERENCE: https://doi.org/10.2298/TSCI2602887D
CITATION EXPORT: view in browser or download as text file
THERMAL SCIENCE YEAR 2026, VOLUME 30, ISSUE No. 2, PAGES [887 - 897]
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Novel analytical solutions for time-fractional thin-film ferroelectric material model

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