TY - JOUR
TI - Novel analytical solutions for time-fractional thin-film ferroelectric material model
AU - Du Ruyuan
AU - Zeng Huajun
AU - Li Can
JN - Thermal Science
PY - 2026
VL - 30
IS - 2
SP - 887
EP - 897
PT - Article
AB - Thin-film ferroelectric materials have been identified as having significant  technological promise in microelectronics, optoelectronics, and sensor  applications owing to their distinctive physical properties. The equation  for thin-film ferroelectric materials with time-fractional derivatives  offers enhanced precision in modeling the physical properties of such  systems. The present study proposes a modified extended tanh-function  approach to derive novel analytical solutions for the time-fractional  thin-film ferroelectric material model. This method has been successfully  implemented to derive various exact solutions to the model and plot their  3-D graphs. The findings of this study offer novel theoretical underpinnings  for both the theoretical research and practical applications of thin-film  ferroelectric materials
DO - 10.2298/TSCI2602887D
ER -